Comprehensive ESD protection guide for USB, HDMI, and RJ45 interfaces using JARON ultra-low capacitance ESD arrays, ensuring signal integrity and ±15kV compliance.
In high-speed communication interfaces such as USB, HDMI, and RJ45, electrostatic discharge (ESD) events are one of the most critical reliability threats.
According to IEC 61000-4-2, discharge peaks can reach ±8kV (contact) and ±15kV (air).
Without proper protection, transient surges can instantly damage the interface ICs, cause data errors, or shorten product lifespan.
The ideal ESD protection solution must achieve low capacitance, fast response, and low clamping voltage — protecting multiple lines while maintaining signal quality across data rates from 480Mbps (USB2.0) to 10Gbps (USB3.1, HDMI2.1).

JARON offers a complete portfolio of ESD protection products designed for high-speed signal lines, covering single-channel, dual-channel, and quad-channel array structures.
|
Product Series |
Typical package |
Capacitance value (typical) |
Clamping voltage |
Response time |
Applicable Interfaces |
|
ESD3V3D5U |
SOD-923 |
0.3pF |
5V |
<0.5ns |
USB 3.0 / HDMI 2.0 |
|
ESD5V0D3B |
SOT-23 |
0.5pF |
6V |
<0.8ns |
RJ45 / Ethernet |
|
ESD9L5V0ST |
SOT-563 |
0.4pF |
5V |
<0.5ns |
Type-C / DisplayPort |
JARON’s ESD portfolio offers ultra-low capacitance (as low as 0.3pF) and sub-nanosecond response time, suitable for USB3.1, HDMI2.1, and Gigabit Ethernet protection.
Ensure that ESD devices with capacitance ≤ 0.5pF are used, and maintain consistent differential impedance across traces to avoid reflection and signal distortion.
Place ESD protection close to the connector (<5mm distance) and ensure multiple ground vias for fast discharge return paths.
Symmetrical placement and length matching in differential pairs preserve timing accuracy and reduce jitter in high-speed links.
Test Conditions:
ESD Test Standard: IEC 61000-4-2 ±8kV Contact Discharge
Signal Rate: 10Gbps (HDMI 2.1)
Equipment: JARON ESD3V3D5U (SOD-923)
|
Test Project |
No protection |
Using JARON ESD |
Improvement effect |
|
ESD residual pressure |
54V |
12V |
↓78% |
|
Signal eye diagram jitter |
±52ps |
±15ps |
↓71% |
|
BER (Bit Error Rate) |
1×10⁻⁶ |
<1×10⁻¹² |
Significant improvement |
|
EMI interference peak |
−24dBµV |
−41dBµV |
Improvement of 17dB |
With JARON ESD arrays, residual voltage dropped from 54V to 12V, jitter reduced by 71%, and bit error rate improved by 1,000,000× — confirming superior ESD performance with full signal preservation.
USB Type-C High-Speed Interface
Utilizes JARON ESD9L5V0ST for four-channel common-mode protection;
Withstands ±15kV air discharge;
Signal bandwidth supports up to 10Gbps.
HDMI 2.1 Video Interface
Utilizes ESD3V3D5U array;
Capacitors are only 0.3pF, not affecting TMDS differential signals;
EMI noise reduction of 16dB.
RJ45 Ethernet Interface
Utilizes ESD5V0D3B;
Bidirectional protection structure, compatible with PoE systems;
Suppresses lightning strikes and electrostatic surges.

|
Interface type |
Recommended Model |
Packaging |
Features |
|
USB 3.0 / 3.1 |
ESD3V3D5U |
SOD-923 |
Ultra-low capacitance 0.3pF |
|
HDMI 2.1 |
ESD9L5V0ST |
SOT-563 |
Fast response time <0.5ns |
|
RJ45 / PoE |
ESD5V0D3B |
SOT-23 |
Two-way protection, high energy absorption |
|
Standard Number |
Test content |
compliant devices |
|
IEC 61000-4-2 |
ESD immunity |
Full series |
|
IEC 61000-4-5 |
Surge test |
ESD5V0D3B |
|
IEC 61000-4-4 |
Burst anti-interference |
ESD3V3D5U |
|
JEDEC JESD22-A114 |
IC-level ESD protection |
Array series |
All JARON ESD components meet international standards, including IEC 61000-4-2 and JEDEC A114, ensuring compatibility with global OEM qualification processes.
|
Dimension |
Improvement effect |
|
Signal Integrity |
Increase by 70% |
|
ESD resistance |
Upgraded to ±15kV |
|
EMI suppression |
Improvement of 16–18 dB |
|
Module space |
Save 50% |
|
Verification cycle |
shorten by 60% |
JARON’s ultra-low-capacitance ESD devices deliver high-speed integrity with robust ±15kV protection — minimizing space, cost, and validation time.
In high-speed data transmission interfaces, traditional ESD diodes can no longer simultaneously provide protection and signal integrity.
JARON's ultra-low capacitance ESD array achieves an engineering balance between protection and performance through high response speed and extremely low parasitic effects.
It has been widely used in high-speed interface designs such as USB Type-C, HDMI, Ethernet, and DisplayPort, becoming a standard protection solution for next-generation communication devices.